大型仪器共享管理系统

"电镜分辨率(SE): 0.7 nm @15 kV，2.0nm@15kV, 5nA, WD 8.5mm；
40nA 高分辨GEMINI Ⅱ系统，无漏磁设计，束流连续调节；
配备能谱仪：无窗设计，有效晶体面积100mm2，元素可探测至Li3，最大计数率：130,000cps
配备EBSD探测器：采用CMOS图像传感器技术，分辨率：1244*1024 pixel resolution/240pps，156*128pixel resolution/3000pps
配备阴极荧光探测器：用于CL成像分析，波长范围/wave range : 300-650nm
Resolution(SE): 0.7 nm @15 kV，2.0nm@15kV, 5nA, WD 8.5mm
40nA maximum resolution configuration GEMINI Ⅱ,Enabling continuous beam current adjustment and no exposure of specimen to a magnetic field
EDS Detector: Windowless detector, possible sensor size up to 100mm2; Detecting X-rays down to Li(54eV); Resolution@130,000cps
EBSD Detector: CMOS sensor technology, 1244*1024 pixel resolution/240pps, 156*128pixel resolution/3000pps
CL Detector: wave range 300-650nm"

"在满足常规的SEM成像应用外，蔡司Gemini450 SEM具备对样品更快的响应和更高的表面灵敏度，Gemini2电子光学镜筒可以快速连续的调节电子束流，对样品进行表面成像，以及快速便捷的EDS能谱和EBSD分析，对不导电样品、磁性样品同样可以高效分析。该电镜配备了蔡司的In-lens SE、In-lens EsB、样品室内E-T SE、aBSD 探测器用于成像分析；蔡司的CL探测器用于阴极荧光成像表征、牛津的EDS、EBSD探测器用于样品的能谱和电子背散射衍射分析。结合以上配置，该设备具备强大的分析功能，满足多种材料多种领域的电镜分析要求。
In addition to routine topography SEM applications, Zeiss Gemini 450 SEM stands for high detecting efficiency and more surface sensitivity for samples. Gemini2 optics offer seamlessly between low and high beam currents, which are suitable for high resolution imaging and fast EDS or EBSD analysis. Even non-conductive or magnetic samples can be imaged easily. This SEM is equipped with In-lens SE、In-lens EsB、chamber E-T SE、aBSD detectors for surface topography, and CL, EDS, EBSD detectors for analytics. This SEM has excellent analysis functions supported with the equipped detectors, and offers various applications for samples."

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主要功能及特色

主要附件及配置